Периодически при загрузке ПК появляется сообщение kernel panic. Система естественно дальше не грузится. Пока не могу понять в чем причина такого поведения, нужна помощь профессионалов. Прикладываю картинку с логами
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Инфа по железу и ПО
red hat - 2.6.32-358.11.1.el6.x86_64
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| [root@server3 ~]# smartctl -a /dev/sdc
smartctl 5.43 2012-06-30 r3573 [x86_64-linux-2.6.32-358.11.1.el6.x86_64] (local build)
Copyright (C) 2002-12 by Bruce Allen, [url]http://smartmontools.sourceforge.net[/url]
=== START OF INFORMATION SECTION ===
Device Model: SET SSD E240-M64
Serial Number: 104064141007
Firmware Version: 110512
User Capacity: 64*023*257*088 bytes [64,0 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Tue Feb 14 12:21:19 2017 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 254) Self-test routine in progress...
140% of test remaining.
Total time to complete Offline
data collection: ( 30) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 1) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 16777215
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0
5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 10017
10 Spin_Retry_Count 0x0013 100 100 050 Pre-fail Always - 0
12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 925
168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
175 Program_Fail_Count_Chip 0x0003 100 100 010 Pre-fail Always - 1
192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 0
194 Temperature_Celsius 0x0022 040 100 000 Old_age Always - 40 (Min/Max 30/60)
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
240 Head_Flying_Hours 0x0013 100 100 050 Pre-fail Always - 0
170 Unknown_Attribute 0x0003 100 100 010 Pre-fail Always - 4295557122
173 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 1868371133141
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Device does not support Selective Self Tests/Logging |
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